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3 datasets for “dimensional metrology”

  1. Data.gov Catalog

    Detection Limits for SEM Image Segmentation

    National Institute of Standards and TechnologyUpdated 12 May 2025

    … This work was performed with funding from the CHIPS Metrology Program, part of CHIPS for America, National Institute …

    • URL
    • ZIP FILE CONTAINS A FOLDER WITH IMAGE QUALITY METRICS AND A FOLDER WITH AI MODEL ACCURACY
    • ZIP FILE WITH SIX SUBFOLDERS CONTAINING SEM IMAGE COLLECTIONS
    • ZIP CONTAINS THREE FOLDERS WITH TENSORFLOW AI MODELS
    • ZIP FILE CONTAINS MASK IMAGES AND THE INITIAL INTENSITY IMAGE WITH MAX CONTRAST AND MIN NOISE
    • PLAIN
  2. Data.gov Catalog

    X-ray Computed Tomography Data of Additive Manufacturing Metrology Testbed (AMMT) Parts: Overhang Part X16

    National Institute of Standards and TechnologyUpdated 3 Dec 2021

    … was a three-dimensional (3D) additive manufacturing (AM) build performed on the Additive Manufacturing Metrology Testbed (AMMT) by …

    • PDF DOCUMENT
    • PDF
    • PLAIN
    • VND.OPENXMLFORMATS-OFFICEDOCUMENT.SPREADSHEETML.SHEET
    • TIFF
  3. Data.gov Catalog

    Process Monitoring Dataset from the Additive Manufacturing Metrology Testbed (AMMT): Overhang Part X16

    National Institute of Standards and TechnologyUpdated 6 Oct 2020

    … to a three-dimensional (3D) additive manufacturing (AM) build performed on the Additive Manufacturing Metrology Testbed (AMMT) by …

    • ZIP
    • PLAIN
    • TIFF
    • PDF
“dimensional metrology” datasets · Open Data Finder