Data.gov Catalog
IGBT accelerated aging data set.
Published by Dashlink
About this dataset
Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and in some cases, high-speed measurements of gate voltage, collector-emitter voltage and collector current are available. The data set is provided by the Prognostics CoE at NASA Ames.